Sick 2D vision

  • High-speed part inspection
  • Robust pattern match algorithm to locate parts independent of position, rotation and scale
  • Multi-reference object teaching and multi-feature inspections per object
  • High-speed part inspection
  • Robust pattern match algorithm to locate parts independent of position, rotation and scale
  • Multi-reference object teaching and multi-feature inspections per object
  • High-speed part inspection
  • Robust pattern match algorithm to locate parts independent of position, rotation and scale
  • Unique, even dome illumination or high-power white or UV ring light
  • High-speed part inspection
  • Robust pattern match algorithm to locate parts independent of position, rotation and scale
  • Unique, even dome illumination or high-power white or UV ring light
  • High-speed part inspection
  • Robust pattern match algorithm to locate parts independent of position, rotation and scale
  • Unique, even dome illumination or high-power white or UV ring light
  • Integrated IR light
  • Optional visible block filter
  • Advanced object locator tool to locate parts independent of position, rotation and scale
  • High-speed part inspection in VGA resolution
  • Robust pattern match algorithm to locate parts independent of position, rotation and scale
  • Powerful part inspection tool set with pattern inspection
  • Integrated UV ring light for inspecting luminescent objects
  • Wide field-of-view for large area inspection
  • Advanced ”object locator” tool to locate parts independent of position, rotation and scale
  • Integrated IR light
  • Optional visible block filter
  • High-speed part inspection in VGA resolution
  • High-speed positioning, inspection and measurement
  • Expanded toolbox for diameter, angle and flexible distance measurement
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • High-speed positioning, inspection and measurement
  • Expanded toolbox for diameter, angle and flexible distance measurement
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • High-speed positioning, inspection and measurement
  • Expanded toolbox for diameter, angle and flexible distance measurement
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • High-speed positioning, inspection and measurement
  • Expanded toolbox for diameter, angle and flexible distance measurement
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • High-speed positioning and guidance
  • Powerful “object locator” tool gives position of taught-in objects
  • Easy-to-use “blob locator” tool to find free form targets
  • High-speed positioning and inspection
  • Expanded toolbox for locating taught-in and free-form objects
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • High-speed positioning and inspection
  • Expanded toolbox for locating taught-in and free-form objects
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • High-speed positioning and inspection
  • Expanded toolbox for locating taught-in and free-form objects
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
  • Color inspection and sorting on large fields of view
  • Inspecting one color, minimum and maximum fill
  • 2-color matching
  • Color inspection and sorting on large fields of view
  • Inspecting one color, minimum and maximum fill
  • 2-color matching
  • Color inspection and sorting on large fields of view
  • Inspecting one color, minimum and maximum fill
  • 2-color matching
  • Color inspection and sorting on large fields of view
  • Inspecting one color, minimum and maximum fill
  • 2-color matching
  • Color inspection and sorting on large fields of view
  • Inspecting one color, minimum and maximum fill
  • 2-color matching
  • Suitable for advanced inspections and measurements
  • Flexible working distance and field of view
  • Stand-alone operation, no PC needed
  • Suitable for advanced inspections and measurements
  • Flexible working distance and field of view
  • Stand-alone operation, no PC needed
  • Suitable for advanced inspections and measurements
  • Flexible working distance and field of view
  • Stand-alone operation, no PC needed
  • Suitable for advanced inspections and measurements
  • Flexible working distance and field of view
  • Stand-alone operation, no PC needed
  • Suitable for advanced inspections and measurements
  • Flexible working distance and field of view
  • Stand-alone operation, no PC needed
  • Suitable for advanced inspections and measurements
  • Flexible working distance and field of view
  • Stand-alone operation, no PC needed
  • High-speed positioning, inspection and measurement
  • Expanded toolbox for diameter, angle and flexible distance measurement
  • Multiple, simultaneous inspection of blobs, patterns, edges and pixel counting
in international format without spaces
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