Baumer Photoelectric Sensors
art. 11080143
| measuring distance Sd | 100 ... 1000 mm |
| adjustment | Teach-in |
| Teach-in range min. | > 50 mm |
| operating temperature | 0 ... +50 °C |
| type | window analysis |
| sensing distance Tw | 16 ... 120 mm |
| Teach-in range min. | > 0,4 mm |
| operating temperature | 0 ... +50 °C |
art. 10165137
| type | through beam laser sensor |
| emitter / receiver | receiver |
| actual range Sb | 8 m |
| operating temperature | -10 ... +50 °C |
art. 10165139
| type | through beam laser sensor |
| emitter / receiver | receiver |
| actual range Sb | 8 m |
| operating temperature | -10 ... +50 °C |
art. 10165141
| type | through beam laser sensor |
| emitter / receiver | receiver |
| actual range Sb | 8 m |
| operating temperature | -10 ... +50 °C |
art. 11229521
- through beam sensor
- 30 mm
- pulsed red laser diode
- Push-Pull
- potentiometer / IO-Link
- connector M8, 3 pin
- -25 ... 60 °C
- IP 67
art. 11229489
- through beam sensor
- 30 mm
- pulsed red LED
- Push-Pull
- potentiometer / IO-Link
- connector M8, 3 pin
- -25 ... 60 °C
- IP 67
art. 11229522
- through beam sensor
- 50 mm
- pulsed red laser diode
- Push-Pull
- potentiometer / IO-Link
- connector M8, 3 pin
- -25 ... 60 °C
- IP 67
art. 11229524
- through beam sensor
- 120 mm
- pulsed red laser diode
- Push-Pull
- potentiometer / IO-Link
- connector M8, 3 pin
- -25 ... 60 °C
- IP 67
| type | through beam sensor |
| object size | > 0,05 mm |
| repeat accuracy | < 0,01 mm |
| operating temperature | 5 ... +45 °C |
| type | through beam sensor |
| object size | > 0,1 mm |
| repeat accuracy | < 0,02 mm |
| operating temperature | 5 ... +45 °C |
art. 10164119
| type | background suppression |
| version | line beam |
| light source | pulsed red laser diode |
| operating temperature | -10 ... +50 °C |
art. 10132110
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 22 ... 130 mm |
| operating temperature | -10 ... +50 °C |
art. 10132112
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 22 ... 130 mm |
| operating temperature | -10 ... +50 °C |
art. 10164118
| type | background suppression |
| version | line beam |
| light source | pulsed red laser diode |
| operating temperature | -10 ... +50 °C |
art. 11001252
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 20 ... 350 mm |
| operating temperature | -10 ... +50 °C |
art. 11001256
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 20 ... 350 mm |
| operating temperature | -10 ... +50 °C |
art. 11079990
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 100 ... 2000 mm |
| operating temperature | 0 ... +50 °C |
art. 11079948
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 100 ... 1000 mm |
| operating temperature | 0 ... +50 °C |
art. 10151381
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 17 ... 120 mm |
| operating temperature | 0 ... +50 °C |
art. 10119524
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 25 ... 300 mm |
| operating temperature | -10 ... +50 °C |
art. 10241873
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 25 ... 300 mm |
| operating temperature | -10 ... +50 °C |
art. 10236806
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 25 ... 300 mm |
| operating temperature | -10 ... +50 °C |
art. 10159134
| type | background suppression |
| version | wafer mapping sensor |
| light source | pulsed red laser diode |
| operating temperature | -5 ... +50 °C |
art. 10153490
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 210 ... 1500 mm |
| operating temperature | 0 ... +50 °C |
art. 11231074
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11232063
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11231078
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11231077
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11233990
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results