Baumer
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art. 10132110
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 22 ... 130 mm |
| operating temperature | -10 ... +50 °C |
art. 10132112
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 22 ... 130 mm |
| operating temperature | -10 ... +50 °C |
art. 10164118
| type | background suppression |
| version | line beam |
| light source | pulsed red laser diode |
| operating temperature | -10 ... +50 °C |
art. 11001252
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 20 ... 350 mm |
| operating temperature | -10 ... +50 °C |
art. 11001256
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 20 ... 350 mm |
| operating temperature | -10 ... +50 °C |
art. 11079990
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 100 ... 2000 mm |
| operating temperature | 0 ... +50 °C |
art. 11079948
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 100 ... 1000 mm |
| operating temperature | 0 ... +50 °C |
art. 10151381
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 17 ... 120 mm |
| operating temperature | 0 ... +50 °C |
art. 10119524
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 25 ... 300 mm |
| operating temperature | -10 ... +50 °C |
art. 10241873
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 25 ... 300 mm |
| operating temperature | -10 ... +50 °C |
art. 10236806
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 25 ... 300 mm |
| operating temperature | -10 ... +50 °C |
art. 10159134
| type | background suppression |
| version | wafer mapping sensor |
| light source | pulsed red laser diode |
| operating temperature | -5 ... +50 °C |
art. 10153490
| type | background suppression |
| light source | pulsed red laser diode |
| sensing distance Tw | 210 ... 1500 mm |
| operating temperature | 0 ... +50 °C |
art. 11224132
- Reliable detection of a wide variety of labels and carrier materials including metallic- or booklet-labels
- Short set-up times without adjustment effort
- Precise label detection even at high conveyor speeds
- Fast commissioning and adjustment thanks to Auto-Teach
art. 11233538
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11231074
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11232063
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11231078
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11231077
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11233990
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results
art. 11231079
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results
art. 11232075
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results
art. 11235107
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results
art. 11231343
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results
art. 11232078
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Line beam shape for particularly robust measurement results on structured surfaces
- Adjustable filters for particularly stable measurement results
art. 11235104
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11232072
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11235106
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11231082
- Automatic adjustment of exposure time for precise measurements on changing materials
- High immunity to ambient light for reliable measurements regardless of ambient conditions
- Point beam shape for a precise measurement
- Adjustable filters for particularly stable measurement results
art. 11216521
- Adjustable reference distance (zero point position)
- Intuitive limitation of the measuring range
- Configurable switching output
- Selectable filters and trigger modes
- Additional data such as signal quality on request
- Export and import function for parameter sets